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22 products
Microscope Systems
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surfaces x
Microscopy x
Microscope Systems x
NewView 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Compass™ 2
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
ZeGage™ Pro
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Contour Elite I
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
MultiMode 8-HR
Bruker Nano Surfaces
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
JPK NanoWizard AFMs
Bruker Nano Surfaces
Type:
Scanning Probe
Innova
Bruker Nano Surfaces
Type:
Scanning Probe
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Bruker Nano Surfaces
Type:
Scanning Probe
Sample Environment — Flow Cell:
60 μL
X-Y Tip-Velocity Max.:
>2 mm/s
Z Range:
≥3 μm
Dimension FastScan
Bruker Nano Surfaces
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
NPFLEX
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Optical Resolution:
0.33 µm
RMS Reapeatability:
0.004 nm
Vertical Resolution:
<0.1 nm
DektakXT
Bruker Nano Surfaces
Type:
Optical
Data Points Per Scan:
120,000 max.
Stylus Force:
1 to 15 mg with LIS 3 sensor
Vertical Range:
1 mm
Dektak XTL
Bruker Nano Surfaces
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Contour Elite K
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
Ultima Multiphoton
Bruker Nano Surfaces
Type:
Scanning Probe
Scan Size:
64 x 64 to 2048 x 2048
Scanning Method:
Pair of 6mm galvanometers
Dimension Icon
Bruker Nano Surfaces
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
S wide
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Display Resolution:
0.001 µm
Max. Extended Measuring area:
300 × 300 mm
Vertical Measuring Range:
40 mm
S neox Five Axis
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S neox
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S mart
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
Microscope Systems Products
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