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13 products

Microscopy

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NewView 3D Optical Profiler
NewView 3D Optical Profiler
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
Compass™ 2
Compass™ 2
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
ZeGage™ Pro
ZeGage™ Pro
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
Nexview™ NX2 3D Optical Profiler
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
Contour Elite I
Contour Elite I
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 73 μm / sec
  • Max Scan Range: ≤10mm
  • Sample Height: Up to 100 mm (4 in.)
JPK NanoWizard AFMs
JPK NanoWizard AFMs
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
NPFLEX
NPFLEX
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Optical Resolution: 0.33 µm
  • RMS Reapeatability: 0.004 nm
  • Vertical Resolution: <0.1 nm
DektakXT
DektakXT
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Data Points Per Scan: 120,000 max.
  • Stylus Force: 1 to 15 mg with LIS 3 sensor
  • Vertical Range: 1 mm
Dektak XTL
Dektak XTL
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Stylus Force: 0.03 mg to 15 mg
  • Vertical Range: 1 mm
  • Vertical Resolution: 1Å max. (@6.55 µm range)
Contour Elite K
Contour Elite K
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 47 μm/sec
  • Max Scan Range: >10 mm
  • Sample Height: Up to 100 mm
aplanoXX
aplanoXX
AdlOptica GmbH
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 20X
  • Spectral Range: VIS,NIR
  • Aberration Correction: Collar
  • Clear Aperture: 20 mm
  • NA: 0.8
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
Model 4200M
Model 4200M
Hinalea Imaging
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS,NIR
  • Number of Spectral Bands: 300 nominal, 600 maximum
  • Sensor Spatial Resolution: 2.3
  • Spectral Range: 4-0 - 1,000 nm
Microscopy Products


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