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Microscopy

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Contour Elite I
Contour Elite I
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 73 μm / sec
  • Max Scan Range: ≤10mm
  • Sample Height: Up to 100 mm (4 in.)
MultiMode 8-HR
MultiMode 8-HR
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Imaging Noise Level: <30 pm rms
  • Maximum Sample Size: 15 mm dia × 5 mm thick
Innova
Innova
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
  • Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
  • Sample Size: 45 mm × 45 mm x 18 mm
Dimension FastScan
Dimension FastScan
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Integral Nonlinearity XYZ: <0.50%
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
Contour Elite K
Contour Elite K
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 47 μm/sec
  • Max Scan Range: >10 mm
  • Sample Height: Up to 100 mm
Ultima Multiphoton
Ultima Multiphoton
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Scan Size: 64 x 64 to 2048 x 2048
  • Scanning Method: Pair of 6mm galvanometers
Dimension Icon
Dimension Icon
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Integral nonlinearity XYZ: <0.5% typical
  • X-Y scan range: 90 μm x 90 μm typical
  • Z range: 10 μm typical in imaging
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
Microscopy Products


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