Search
Menu
OSI Optoelectronics - Custom Solutions LB 5/23
Photonics Marketplace
Suppliers Products
Handbook Institutions Dictionary

Show Filters
Hide Filters
Products by Category
< All Categories< SpectroscopySpectrometersBenchtopPortable

Applications

Measurement Techniques

Excitation Wavelength (nm)
-

Spectral Range (nm)
-

Max. Resolution (nm)
-

Pixel Count (total pixels)
-

Width
Dimensions
-

Length
Dimensions
-

Height
Dimensions
-

Weight (kg)
-

Zurich Instruments AG - Explore Nanoscale 6/24 MR
Optimax Systems, Inc. - Optical Components & Systems 2024 HP
6 products

Spectrometers

Clear All Filters xIR light source xSpectroscopy xSpectrometers x
MISS Mini Imaging Spectrometer
MISS Mini Imaging Spectrometer
Femto Easy
  • Type: Portable
  • Spectral Range (nm): 240 - 1100
  • Max. Resolution (nm): 0.23
  • Pixel Count (total pixels): 2e+007
  • Width: 102mm
  • Length: 101mm
  • Height: 52mm
GEMINI Interferometer
GEMINI Interferometer
NIREOS
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence,FTIR,Reflectance and Transmission,Raman
  • Spectral Range (nm): 250 - 3500
  • Max. Resolution (nm): 0.5
  • Width: 100mm
  • Length: 110mm
  • Height: 65mm
  • Delay Stability: < 1 attosecond
  • Max. Delay [fs @ λ=600 nm]: from -100 fs to +2 ps
PHOS-4 Temperature Regulated Fiber Optic LED Source
PHOS-4 Temperature Regulated Fiber Optic LED Source
SpectrEcology
  • Type: Benchtop
  • Measurement Techniques: Absorption,Fluorescence,Reflectance and Transmission,Inelastic Scattering
  • Excitation Wavelength (nm): 280
  • Spectral Range (nm): 285 - 730
  • Max. Resolution (nm): 15
  • Width: 90mm
  • Length: 66mm
Model 234/302
Model 234/302
McPHERSON
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence,Reflectance and Transmission,Inelastic Scattering,Raman,Other
  • Spectral Range (nm): 30 - 2200
  • Max. Resolution (nm): 0.05
  • Width: 30cm
  • Length: 30cm
  • Height: 30cm
  • Focal Length: 200 mm
  • High Vacuum 10e-6: UHV 10e-9 optional
  • Optical Design: Aberration corrected
Model 248/310
Model 248/310
McPHERSON
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence,Reflectance and Transmission,Other
  • Spectral Range (nm): 0.98 - 310
  • Max. Resolution (nm): 0.007
  • Pixel Count (total pixels): 1.04858e+006
  • Width: 35cm
  • Length: 50cm
  • Angle of incidence: 87 degrees
  • Focal Length: 1 m
  • High vacuum: 10E6 (UHV optional)
aRTie Thin-Film Measurement System
aRTie Thin-Film Measurement System
Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption,Reflectance and Transmission,Other
  • Spectral Range (nm): 380 - 1050
  • Thickness Accuracy: Greater of 0.2% or 2 nm
  • Thickness Range: 15nm - 70µm
Spectrometers Products


Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps

About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship

Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)



©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.