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Measurement Techniques
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Raman
Reflectance and Transmission
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6 products
Spectrometers
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wavelength measurement x
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Spectrometers x
PHOTON RT 0420 Ultra
EssentOptics Europe UAB
Type:
Benchtop
Measurement Techniques:
Absorption,Reflectance and Transmission
Spectral Range (nm):
340 - 2000
Max. Resolution (nm):
0.06
Optical Density:
Up to OD8
Sample Size (Max):
150 mm
Slope Steepness:
Down to 0,02%
WP Raman Series Spectrometers
Wasatch Photonics Inc.
Type:
Portable
Measurement Techniques:
Raman
Excitation Wavelength (nm):
785
Spectral Range (nm):
100 - 3600
Max. Resolution (nm):
7
Pixel Count (total pixels):
2048
Width:
13.5cm
Detector Cooling:
Optional to -15°c
Integrated Laser:
optional
Numerical Aperture:
f/1.3
HyperFlux™ U1
Tornado Spectral Systems
Type:
Benchtop
Measurement Techniques:
Raman
Excitation Wavelength (nm):
785
Spectral Range (nm):
749 - 1024
Max. Resolution (nm):
0.38
Width:
50.8cm
Length:
29.8cm
Detector:
Andor iDUS DU416A-LCD-DD
NS MiniTracer
Applied NanoFluorescence LLC
Type:
Benchtop
Measurement Techniques:
Absorption,Emission,Fluorescence
Excitation Wavelength (nm):
638
Spectral Range (nm):
900 - 1600
Max. Resolution (nm):
5
Pixel Count (total pixels):
512
Width:
182mm
Absorption Option:
900-1600 nm
Near-Infrared Emission:
900-1600 nm
F20 Thin-Film Measurement System
Filmetrics, KLA Instruments
Type:
Benchtop
Measurement Techniques:
Absorption,Reflectance and Transmission,Other
Spectral Range (nm):
190 - 1690
Thickness Accuracy:
As little as 1 nm or 0.2%
Thickness Range:
1 nm - 450 um
aRTie Thin-Film Measurement System
Filmetrics, KLA Instruments
Type:
Benchtop
Measurement Techniques:
Absorption,Reflectance and Transmission,Other
Spectral Range (nm):
380 - 1050
Thickness Accuracy:
Greater of 0.2% or 2 nm
Thickness Range:
15nm - 70µm
Spectrometers Products
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