Photonics Dictionary: N

A network interface card (NIC), also known as a network adapter or LAN adapter, is a hardware component that allows computers to connect to a local area network (LAN) and communicate with other...

A lithography method that allows the transfer of fine-pitch gratings from a phase mask into photoresist. The exposure takes place with the light coming under an oblique angle to the mask. The...

The area closest to an aperture or source where the diffraction pattern differs substantially from that observed at an infinite distance, or more specifically, the far field. Also referred to as the...

A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less...

A measurement technique used to determine the spatial distribution profile of an electrical or optical quantity of interest which is provided by multiple scans within the near-field region of a...

In a laser diode, lateral motion of the beam center at the facet when the drive current is changed.

A defect in infrared systems that appears as a dark circular area on a displayed image, caused by radiation reflecting into a detector. It can be reduced by low-reflective coatings or by altering the...

An imaging system designed to highlight small deviations in a planar reflective object such as a mirror. The system can be used to detect minute flaws or to image faint marks that are made in the...

A near-infrared (NIR) camera is an imaging device designed to capture images in the near-infrared region of the electromagnetic spectrum. The near-infrared spectrum typically extends from about 700...

A near-infrared (NIR) spectrometer is an analytical instrument used to measure the absorption, transmission, or reflection of light in the near-infrared region of the electromagnetic spectrum....

A Nernst glower, also known simply as a Nernst lamp or Nernst filament, is a type of incandescent lamp or radiant heater based on the Nernst effect. It was invented by the German physicist and...

Neuromorphic refers to the design and development of computing systems or devices that are inspired by the structure and functioning of the human brain and nervous system. The term is derived from...

A coating applied to a neutral density glass that is designed to reduce the amount of light evenly across the transmitted light spectrum with no color distortion. These coatings are designed to...

The series of rings or bands formed when light beams reflected from two polished, adjacent surfaces, placed together with a thin film of air between them, interfere. By counting these bands from the...

A prism invented by William Nicol in 1828 that is made of calcite, the end faces of which are ground to an angle of 68° between one vertical side and the end surface. The prism is cut diagonally...

Also referred to as differential interference contrast (DIC) microscopy; Nomarski microscopy is a unique form of microscopy especially suited for the evaluation of surface quality and defects as well...

Sometimes referred to as the surface normal or 'surface norm'; the normal is an axis that forms right angles with a surface that light is incident upon or with other lines. The normal is used to...

Condition in which a perpendicular surface can be discovered for every ray in a group. This condition is commonly observed when rays emerge from a point source or object that is placed at the center...

The emergence of a ray along the normal to the emergent surface of a medium.

Light striking a surface at an angle perpendicular to the surface.

A plane along which destructive interference takes place.

A lens used in the optical testing of an aspheric surface. It converts a spherical wavefront into one that precisely matches the surface under test. When the wavefront is reflected from that surface,...

Commonly performed in spectroscopy, the optical null process is a method for radiation detection whereby physical detectors are used to rapidly interchange the intensity between a reference beam and...