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Test & Measurement Articles

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Scatter and BSDF Measurements: Theory and PracticeScatter and BSDF Measurements: Theory and Practice
Richard Pfisterer, Photon Engineering LLC
Except for direct illumination from the sun, laser, or other light source, everything we see or detect is ultimately scattered light. Light can be scattered or rescattered during its propagation to...
Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Measuring Small-Beam MFD: Overcoming the ChallengesMeasuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Aspheric Lenses: Optimizing the DesignAspheric Lenses: Optimizing the Design
Jeremy Govier, Edmund Optics Inc.
With the understanding of aspheric lens manufacturing provided in part one of this article, designers have the tools to optimize their aspheres; the next step is to understand how to specify and...
Laser Beam Measurement: Slit-Based Profilers for Pulsed BeamsLaser Beam Measurement: Slit-Based Profilers for Pulsed Beams
Allen M. Cary, Photon Inc.
Measuring pulsed-beam lasers has generally required the use of a CCD array profiler. This is a reasonable solution for low-power lasers in the UV and visible wavelength range, but these require...
Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Quantifying Light: Intensity, Uniformity Hold the KeyQuantifying Light: Intensity, Uniformity Hold the Key
Steven Giamundo, Fiberoptics Technology, Inc.
Intensity and uniformity can be described using different physical attributes, which makes interpreting requirements somewhat confusing. This article intends to provide an explanation and serve as a...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Photometry: The Answer to How Light Is PerceivedPhotometry: The Answer to How Light Is Perceived
Photo Research, Inc.
That portion of the spectrum that the eye can see — and its rainbow of colors — is rather small, covering approximately 360 to 830 nm. What colors we perceive depends on wavelength, while...
Radiometry: A Simplified Description of Light MeasurementRadiometry: A Simplified Description of Light Measurement
Angelo V. Arecchi, Labsphere, Inc.
Radiometry involves several activities. The two most common are the description and measurement of optical radiation, and, starting with the knowledge of some aspects of optical radiation at one...
Spectroscopy: Mastering the TechniquesSpectroscopy: Mastering the Techniques
Dr. John R. Gilchrist, Clyde HSI
The scope of optical spectroscopic instrumentation is indeed very broad. Many analytical methods rely on the interaction of radiation with matter and are often described in the context of quantum and...
NSOM: Discovering New WorldsNSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
Spectrum Analysis for DWDM: New Instruments Meet the ChallengeSpectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
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