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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers
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Test & Measurement Articles

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Laser Measurement Systems: Best PracticesLaser Measurement Systems: Best Practices
JOHN MCCAULEY, MKS Ophir
Given the pace at which technology advances, there always seems to be a learning curve. With the abundance of consumer electronics available, there typically is no right or wrong way to use these...
Understanding Surface Quality: A Practical GuideUnderstanding Surface Quality: A Practical Guide
John C. Smith, Rocky Mountain Instrument Co. (RMI)
Surface quality has become one of the most poorly understood specifications in the optics industry. A significant portion of the confusion stems from the two major competing (and largely...
Interferometry: Measuring with LightInterferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Integrating Spheres: Collecting and Uniformly Distributing LightIntegrating Spheres: Collecting and Uniformly Distributing Light
Greg McKee, Labsphere Inc.
An integrating sphere’s function is to spatially integrate radiant flux (light). However, before one can optimize a sphere design for a particular application, it is important to understand how...
Optical Delay Lines: Key to Time-Resolved MeasurementsOptical Delay Lines: Key to Time-Resolved Measurements
MKS/Newport
One of the most critical elements of any time-resolved spectroscopy and dynamics experiment is the optical delay line. A typical optical delay line consists of a retroreflector or folding mirrors on...
Radiometry: A Simplified Description of Light MeasurementRadiometry: A Simplified Description of Light Measurement
Angelo V. Arecchi, Labsphere, Inc.
Radiometry involves several activities. The two most common are the description and measurement of optical radiation, and, starting with the knowledge of some aspects of optical radiation at one...
Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Laser Beam Measurement: Slit-Based Profilers for Pulsed BeamsLaser Beam Measurement: Slit-Based Profilers for Pulsed Beams
Allen M. Cary, Photon Inc.
Measuring pulsed-beam lasers has generally required the use of a CCD array profiler. This is a reasonable solution for low-power lasers in the UV and visible wavelength range, but these require...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Spectroscopy: Mastering the TechniquesSpectroscopy: Mastering the Techniques
Dr. John R. Gilchrist, Clyde HSI
The scope of optical spectroscopic instrumentation is indeed very broad. Many analytical methods rely on the interaction of radiation with matter and are often described in the context of quantum and...
Particle Image Velocimetry: Basics, Developments and TechniquesParticle Image Velocimetry: Basics, Developments and Techniques
M. Kelnberger, InnoLas GmbH; G. Schwitzgebel, Universität Mainz
Particle image velocimetry (PIV) is an experimental tool in fluid mechanics and aerodynamics. The basic principle involves photographic recording of the motion of microscopic particles that follow...
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