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PI Physik Instrumente - Semiconductor Applications 5/24 LW LB
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13 articles

Test & Measurement Articles

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Measuring Aspheres: Selecting the Best TechniqueMeasuring Aspheres: Selecting the Best Technique
AMY FRANTZ, EDMUND OPTICS INC.
The benefits of aspheric lenses are numerous: They allow for a reduction in spherical aberrations and are ideal for focusing or collimating light, as they can achieve a low ƒ-number. Aspheres...
Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Interferometry: Measuring with LightInterferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Optical Delay Lines: Key to Time-Resolved MeasurementsOptical Delay Lines: Key to Time-Resolved Measurements
MKS/Newport
One of the most critical elements of any time-resolved spectroscopy and dynamics experiment is the optical delay line. A typical optical delay line consists of a retroreflector or folding mirrors on...
Laser Beam Measurement: Slit-Based Profilers for Pulsed BeamsLaser Beam Measurement: Slit-Based Profilers for Pulsed Beams
Allen M. Cary, Photon Inc.
Measuring pulsed-beam lasers has generally required the use of a CCD array profiler. This is a reasonable solution for low-power lasers in the UV and visible wavelength range, but these require...
Photometry: The Answer to How Light Is PerceivedPhotometry: The Answer to How Light Is Perceived
Photo Research, Inc.
That portion of the spectrum that the eye can see — and its rainbow of colors — is rather small, covering approximately 360 to 830 nm. What colors we perceive depends on wavelength, while...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Spectroscopy: Mastering the TechniquesSpectroscopy: Mastering the Techniques
Dr. John R. Gilchrist, Clyde HSI
The scope of optical spectroscopic instrumentation is indeed very broad. Many analytical methods rely on the interaction of radiation with matter and are often described in the context of quantum and...
Spectrum Analysis for DWDM: New Instruments Meet the ChallengeSpectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
Particle Image Velocimetry: Basics, Developments and TechniquesParticle Image Velocimetry: Basics, Developments and Techniques
M. Kelnberger, InnoLas GmbH; G. Schwitzgebel, Universität Mainz
Particle image velocimetry (PIV) is an experimental tool in fluid mechanics and aerodynamics. The basic principle involves photographic recording of the motion of microscopic particles that follow...
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