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PI Physik Instrumente - Semiconductor Applications 5/24 LW LB
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Test & Measurement Articles

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Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Measuring Small-Beam MFD: Overcoming the ChallengesMeasuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Radiometry: A Simplified Description of Light MeasurementRadiometry: A Simplified Description of Light Measurement
Angelo V. Arecchi, Labsphere, Inc.
Radiometry involves several activities. The two most common are the description and measurement of optical radiation, and, starting with the knowledge of some aspects of optical radiation at one...
Photometry: The Answer to How Light Is PerceivedPhotometry: The Answer to How Light Is Perceived
Photo Research, Inc.
That portion of the spectrum that the eye can see — and its rainbow of colors — is rather small, covering approximately 360 to 830 nm. What colors we perceive depends on wavelength, while...
Quantifying Light: Intensity, Uniformity Hold the KeyQuantifying Light: Intensity, Uniformity Hold the Key
Steven Giamundo, Fiberoptics Technology, Inc.
Intensity and uniformity can be described using different physical attributes, which makes interpreting requirements somewhat confusing. This article intends to provide an explanation and serve as a...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Spectrum Analysis for DWDM: New Instruments Meet the ChallengeSpectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
NSOM: Discovering New WorldsNSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
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