MINISPECTROMETERS
MKS/NewportRequest Info
Newport Corp.'s OSM series minispectrometers can be used for quantitative colorimetry or thin-film thickness measurements with software modules that are compatible with the company's Windows-based suite. The Color-Analyst, which extends the instruments' capabilities in the printing, glass, lighting, dye, phosphor and textile industries, converts spectral data into coordinates for common color space standards. The Layer Thickness Measurement program for plastics and semiconductor metrology is designed to work with a Newport probe to measure up to three materials with thicknesses ranging from 0.1 to 20 µm.
https://www.newport.com
/Buyers_Guide/MKS_Newport/c10218
Published: December 2004
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to MKS/Newport by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required