Single-crystal x-ray CMOS image sensors for inspection applications have been released by Hamamatsu Corp. The C7942 and C7943 large-area sensors offer a 12-bit dynamic range, producing images with enhanced contrast. They use compact digital output and binning to achieve a capture rate of 30 fps. The company says the sensors are designed with a single 8-in. silicon wafer using state-of-the-art CMOS technology, allowing a typical fill factor of 90%. Readout amplifiers are monolithically manufactured to the sensors, resulting in a low-noise readout.