Request InfoScientific Computing InternationalFilmSpectrum from Scientific Computing International is thin-film characterization and metrology software that calculates the index of refraction, extinction coefficient and film thickness from spectrophotometric data. The software supports automated data acquisition from several commercially available spectrophotometers, including the Ocean Optics line. The software comes with Visual Basic macro language, enabling customized acquisition from most spectrophotometers.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra June 2023 IssueThin-Film Metrology SystemThe kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. 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