Jul 2003Renishaw Inc.Request Info
In partnership with JEOL USA, Renishaw plc's Spectroscopy Products Div. has announced a structural and chemical analyzer that incorporates Raman, photoluminescence and cathodoluminescence spectroscopies directly within the scanning electron microscope sample chamber. Combining the resolving power of scanning electron microscopy with molecular spectroscopy allows unambiguous analysis of a range of samples at the micron scale in high-vacuum, ultrahigh-vacuum and other environmental conditions. Fully retractable optics are inserted between the microscope's objective lens and the sample, allowing the sample to be viewed using secondary electron imaging and analyzed using energy-dispersive spectroscopy.