Offering rapid, repeatable LED measurement, the OmniLed system from Labsphere Inc. consists of a radiometer, a spectrograph and a selection of optical heads. Suitable for production and laboratory environments, the system enables users to measure flux at the wafer level. Because it can be used from this level through complete LED assembly, it nearly eliminates the variability resulting from the use of different measurement equipment. OmniLed measures optical flux or intensity, current, voltage, optical power and common colorimetric data. Options include multiple heads for a broad measurement range and the ability to manipulate collected data for binning, wafer mapping and integration into the manufacturing information system.