The AxoScan polarimeter from Axometrics Inc. measures retarders, wave plates, polarizers, depolarizers, beamsplitters, fiber optic devices, LCD components, optical assemblies and scattering samples. Designed for the 450- to 800-nm range, it also can be configured for other wavelengths. When used with the optional X-Y scanning table, it maps spatial variations, including optical rotation and circular dichroism. Templates for round and square samples are provided, and the user may change the step and sample sizes and the center position. Measurements can be made at each point on a user-created text file containing a list of X-Y- coordinates. The system can measure more than three sites per second, or can be programmed to dwell on each site indefinitely and to average the measurements.