Jun 2004dBm Optics Inc.Request Info
The model 280 photodiode test system introduced by dBm Optics Inc. enables PIN and avalanche photodiode suppliers to characterize the parametric performance of their components in R&D, quality assurance and production. Measurement noise of <200 fA results in accurate dark current characterization. Complete characterization of a photodiode, including responsivity and polarization dependency over a wavelength, is performed in <8 s. Real-time referencing eliminates traditional errors in responsivity measurement. The system can test one photodiode or hundreds in one system. The company says that it is accurate, fast and inexpensive.