A laser-bar handling, inspection and test station has been introduced by Telops. The V3000-Bar improves production throughput in semiconductor laser manufacturing and reduces operator-related product damage. It handles laser diode bars from support media, including wafer tape, waffle packs, Gel-paks and facet coating fixtures. Options include automated optical inspection and electro-optical testing. Information is sent to a central database and is available in real time through an Ethernet connection. Optical inspection can be used to accept or reject samples based on quantitative assessment of high-resolution digital images.