Aug 2004Filmetrics Inc.Request Info
The F50 thin-film mapping system unveiled by Filmetrics Inc. measures thickness and optical constants of films between 100 Å and 450 µm and also can measure refractive index. It performs 89-point mappings in <1 min. The system illuminates the sample with white light and measures the reflectance spectrum off the film, and software analyzes the spectrum to determine thickness, optical constants and other user-selectable parameters. Wavelength range is between 220 and 1700 nm.