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THIN-FILM MAPPING

Photonics Spectra
Aug 2004
Filmetrics Inc.Request Info
 
THIN-FILM MAPPING The F50 thin-film mapping system unveiled by Filmetrics Inc. measures thickness and optical constants of films between 100 Å and 450 µm and also can measure refractive index. It performs 89-point mappings in <1 min. The system illuminates the sample with white light and measures the reflectance spectrum off the film, and software analyzes the spectrum to determine thickness, optical constants and other user-selectable parameters. Wavelength range is between 220 and 1700 nm.


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GLOSSARY
spectrum
See optical spectrum; visible spectrum.
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