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METROLOGY TOOLS

Photonics Spectra
Sep 2004
Ocean Optics Inc.Request Info
 
Ocean Optics Inc. is offering a line of turnkey metrology systems for thin-film measurement, plasma analysis and optics characterization. PlasCalc is an optical emission spectrometer and control system that monitors and controls plasma processes. SpecEl is an ellipsometry tool for analyzing the thickness of optical layers from 10 nm to 250 µm, and the LTP long-trace profilometer, an interferometric optical profiling instrument, performs absolute figure measurement of optical components up to 1500 mm in diameter. All are based on the company's miniature fiber optic spectroscopy technology.


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