THIN-FILM MEASUREMENT
Ocean Optics - Part of Ocean InsightRequest Info
NanoCalc, a thin-film reflectometry system unveiled by Ocean Optics Inc., can measure three layers 10 nm to 250 µm thick in less than 1 s. It is suitable for online thickness measurement of silicon-nitride and photoresist films; of rough metal, ceramic and plastic substrates; and of coatings in the semiconductor, automotive, packaging and biotechnology industries. The included software enables curve-fitting and accuracy measurements, and provides a library of refractive index and other values for various materials.
https://www.oceanoptics.com
/Buyers_Guide/Ocean_Optics_-_Part_of_Ocean_Insight/c10604
Published: October 2004
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