Request InfoPerkinElmerThe LC-PolScope macro imaging system from Cambridge Research & Instrumentation (CRI) Inc. is designed to measure retardance and slow-axis orientation of a 40 × 30-mm sample in less than 3 s. The system provides a method for measuring and analyzing low-level birefringence in samples with 0.02-nm sensitivity. It automates the process of quantitative birefringence metrology, allowing the user to calculate retardance magnitude and orientation at every pixel within seconds. The instrument can be used to measure stress in glass, glass-to-metal interfaces, optical materials, disks, thin films,...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra April 2023 IssueSilica Core Optical FibersThe Optran® Plus UV and Optran Plus WF pure fused silica core fibers from Armadillo SIA feature high numerical aperture and spectral transmission from 190 to 2400 nm with low optical losses. ...Photonics Spectra June 2023 IssueThin-Film Metrology SystemThe kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. The system uses an X-ray source, detector, and...Photonics.com 5/13/2022Metrology and Surface Imaging Software PlatformThe fully 64-bit TrueMap® 6 software platform for surface imaging and analysis from TrueGage contains multi-threaded algorithms, a redesigned user interface, and new capabilities. 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