Search
Menu
Deposition Sciences Inc. - Difficult Coatings - LB - 8/23

SCANNING MICROPROBE

JEOL USA Inc.Request Info
 
Facebook X LinkedIn Email
SCANNING MICROPROBE The JAMP-9500F scanning Auger microprobe for high-resolution surface analysis of microareas from JEOL USA Inc. is suitable for identifying killer defects in interfaces and for analyzing coatings and composites. It achieves minimum probe diameters of 3 and 8 nm for secondary electron imaging and Auger imaging, respectively. Features include a neutralizing ion gun, a tilting specimen stage and a low-aberration objective lens. It incorporates a hemispherical energy analyzer that can vary energy resolution from 0.05% to 0.06%, and it can analyze smaller features of larger samples of up to 95 mm in diameter. The device can be used for electron back-scattered diffraction observation of electron channeling patterns without contamination as well as for low-accelerating voltage energy dispersive x-ray spectrometer analysis.


Published: January 2005
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Coatingselectron imagingJEOL USA Inc.microareasNew Productsscanning Auger microprobespectroscopysurface analysis

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.