Request InfoKeithley Instruments Inc.Keithley Instruments Inc. has announced its series 2600 System SourceMeter instruments for testing electronic components. Based on proprietary and patent-pending third-generation source-measure technology, the instruments combine a high-throughput source-measure unit (SMU) with a scalable form factor for integration of 1 to 16 SMU channels into systems. Two models are available: the 2601 single-channel and the 2602 dual-channel. The embedded Test Script Processor lets users program a sequence of test commands and execute high-speed automated test sequences independent of a PC. Test Script...See full productRelated content from Photonics MediaWEBINARSPhotonics.com 10/27/2021Fiber Optic Solutions for Medical DevicesSteve Allen provides a brief overview and examples of procedures that continue to push adoption and proliferation of optical fiber-based medical devices. From cosmetic surgery to cutting-edge sensing...Photonics.com 3/27/2024Precision Planning: Simplified Laser Scanning with Predictive SoftwareConventional controllers for laser scan systems do not allow to predict the actual path of the laser beam on the work piece. A tedious process of testing different parameters and delay settings...Photonics.com 1/18/2018Fiberguide RARe Motheye Fiber: Random Anti-Reflective (RARe) Nanostructures on Optical Fibers as Replacement for AR CoatingsAnti-reflective (AR) coatings are now entering their second century and have remained virtually unchanged throughout their life. As power level and wavelength range requirements continue to increase,...Photonics.com 7/20/2023Motorized and Calibrated Lenses for Machine Vision ApplicationsMany applications have benefited from motorized varifocal lenses that allow automatic or remote adjustment of focus distance and field of view. Applications may need to change the focal length or...