Sep 2005JEOL USA Inc.Request Info
The SM-09010 cross-section polisher from JEOL USA Inc. prepares smooth, thin specimens of materials for examination under scanning electron microscopes. It is suitable for the preparation of samples of layered and composite structures, including solder bumps, wire bonds and printed wiring boards. The system uses an argon-ion beam with a 500-µm spot size to produce specimens up to 11 mm in width for analysis by energy-dispersive x-ray spectroscopy, wavelength-dispersive x-ray spectroscopy, Auger electron microscopy and electron backscatter diffraction. Using an optional rotation specimen holder, the system can cut powders of hard materials such as ceramic particles.