Sep 2005dBm Optics Inc.Request Info
A technique for characterizing the polarization dependence of polarization-sensitive optical devices has been announced by dBm Optics Inc. It allows rapid extraction of the spectra corresponding to the TE- and TM-incident Stokes vectors from a fast-matrix polarization-dependent loss (PDL) measurement. It eliminates the need for manual calibrations and, using the Component Spectrum Analyzer, takes advantage of the Mueller matrix calculations to extract the TE and TM information on the fly. Wavelength dependence of the two states is displayed, along with the insertion loss and the PDL. Polarization dependence of the bandwidth and of the center wavelength also is displayed automatically.