Dec 2005Asylum ResearchRequest Info
Asylum Research has introduced the MFP-3D extended scan head for use with its MFP-3D atomic force microscopy systems. The scan head contains an extra piezo stack that enables an increased scan range of 28 µm along the Z-axis for samples with high features, and for such bioscience applications as live-cell and plant imaging, and for pulling on long-chained molecules. It incorporates the companys nanopositioning sensors, which provide a Z-sensor noise of <0.3 nm Allan deviation (Adev) and a Z-height noise of <0.06 nm Adev in a bandwidth from 0.1 Hz to 1 kHz. Sensor nonlinearity is <0.2% (Adev/full travel) at full scan.