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THIN-FILM METROLOGY

Photonics Spectra
Jul 2006
Semiconsoft Inc.Request Info
 
Available from Semiconsoft Inc., TFCompanion 3.0 is a powerful software package for thin-film metrology applications, including semiconductors and biotechnology. This version fully supports imaging ellipsometry and reflectometry data analysis as well as image processing and analysis features for biochip applications. The software enables users to select feature sets relevant to their application requirements, and it now offers integrated data acquisition and control for spectrometers from Ocean Optics Inc. and Avantes Inc. It also supports measurement of thick, transparent substrates, such as those found on LCDs and solar cells. Network-integrated and OEM versions are available.


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