Jan 2007Agilent Technologies Inc.Request Info
Agilent Technologies’ model 5400 modular atomic force/scanning probe microscope provides atomic resolution for research, industry and teaching applications. It is suitable for use in materials science, polymers, general surface characterization and nanolithography. The scanner snaps into place and has quick-install nose cones that enable convenient switching of imaging modes. Other features include open access to the sample plates and simple alignment of optics. The PicoView software has streamlined GUIs for intuitive operation. The system includes the microscope, an open-loop multipurpose scanner with scan ranges of 9 and 90 μm, force modulation and phase imaging.