For applications between 1 and 1.5 μm, IRLabs Inc. has introduced the Irem-II emission microscope that provides failure analysis, yield enhancement and debugging with visibility to the faintest levels of near-IR emission. Optimized for photoemission, it switches to thermal emission using the Irem-I MCT detection system. Via a proprietary high-sensitivity InGaAs focal plane array and high-numerical-aperture optics, the microscope performs fault localization quickly and precisely. The photoemission camera uses cryogenic electronics to detect design errors and component failures at low voltages. The microscope is fully supported by the company’s Airis software.