Search
Menu
Zurich Instruments AG - Boost Your Optics 1-24 LB

Metrology for Complex 3-D Objects

ASE Optics LLC (See Rochester Precision Optics)Request Info
 
Facebook X LinkedIn Email
Ase Optics Inc. has developed a unique non-contact scanning metrology instrument capable of measuring the surface profile and optical thickness of 3-D objects at a spatial resolution of 25 µm and a measurement accuracy of 100 nm.

The instrument features a commercial Lumetrics OptiGauge that utilizes low coherence dual-wavelength interferometry technology originally invented at Eastman Kodak Co. to simultaneously measure the optical thickness of all layers within multilayer materials.


Published: May 2007
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to ASE Optics LLC (See Rochester Precision Optics) by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

3-DASE Opticsdual-wavelengthIndustry EventsinterferometersKodakLumetricsmetrologynon-contactOptiGaugephotonicsProductsscanningTest & Measurementthickness

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.