Request InfogetAMOSentronic GmbH/getSys has released the getAlyser NIR 1.7 for near-IR measurements and spectroscopic analysis. It performs contact-free component and property analysis on powders, granulates and compounds. Substrate samples in a rotating dish are analyzed optically, with results displayed graphically within minutes via a USB interface and included software. The unit has an integrated Peltier-cooled InGaAs detector, a reflection measurement head for diffuse reflections, a durable tungsten halogen source and a turntable to increase the measurement spot size. 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