Request InfoVeeco Instruments Inc.Veeco Instruments Inc. has developed the HarmoniX atomic force microscope (AFM) technique by which users can simultaneously capture quantitative maps of material properties such as elasticity, adhesion, dissipation and peak force. It is available on all of the company’s scanning probe microscopes that are powered by the NanoScope V controller and probes. HarmoniX acquires real-time force curves by measuring the cantilever’s torsional motion each time the AFM tip interacts with the surface, and proprietary analyses instantly calculate sample characteristics and provide results in image maps...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics May/Jun 2023 IssueKinetic Plate ImagerThe FDSS-GX kinetic plate imager from Hamamatsu Photonics KK is designed for kinetic cell-based assay development including G-protein-coupled receptors or ion channel research and screening for drug...BioPhotonics Mar/Apr 2024 IssueOphthalmic MicroscopeThe Proveo 8 from Leica Microsystems is an ophthalmic microscope with an integrated EnFocus intraoperative OCT. 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It is a type of scanning probe microscope that...Photonics Dictionarypiezoelectric motion systemsPiezoelectric motion systems are mechanical systems that utilize piezoelectric materials to generate controlled motion or displacement. 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