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PI Physik Instrumente - Space Qualified Steering LW 1-15 MR

TFE Scanning Microscope

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JEOL USA Inc.
PEABODY, Mass., Aug. 4, 2008 – JEOL USA has released the JSM-7600F thermal field emission scanning electron microscope to minimize beam damage on heat sensitive samples and to offer improved stability on long-term, unattended data acquisition. Combining high resolution imaging and high speed analysis, the microscope integrates a semi-in-lens objective lens with an in-lens thermal electron gun. The gun, combined with an aperture angle optimizing lens, can achieve a probe current of 200 nA or higher at an accelerating voltage of 15 kV. The microscope has a guaranteed resolution at a high accelerating voltage of 1.0 nm (30...See full product

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