Request InfoQED Technologies Inc.ROCHESTER, N.Y., Jan. 12, 2009 – QED Technologies Inc. has released the Aspheric Stitching Interferometer (ASI) metrology system to measure steep aspheres. The ASI measures aspheres with as much as 1000 waves of departure from the best fit sphere without the use of null lenses or computer-generated holograms, reducing the lead time for producing aspheres. It is based on the company’s subaperture stitching technology and is complemented by its patent-pending Variable Optical Null technology, a programmable opto-mechanical subsystem that generates a wavefront closely matching the surface of the asphere subaperture being...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra August 2023 IssueSemiconductor Metrology ToolThe FRT MicroProf® PT from FormFactor Inc. is a metrology and inspection system for high-throughput panel measurement in advanced packaging. 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