A solution to measure thin films was introduced by Horiba Jobin Yvon. The Auto SE measurement tool allows full automatic analysis of thin-film samples with push-button operation. A complete report that fully describes the thin-film stack, including thickness, optical constants, surface roughness and film inhomogeneities, is delivered in seconds, and it offers a variety of automatic features. The measurement tool is suitable for functional coatings, flat panel displays, biological and chemical engineering, semiconductors and photovoltaic device applications. The MyAutoView vision system component allows users to visualize the measurement site for many samples and can locate the exact positioning of the measurement spot on a sample.