Jan 2009Carl Zeiss Ltd.Request Info
Carl Zeiss Ltd.’s Axio CSM 700 confocal microscope performs rapid and robust noncontact measurement of 3-D microstructures and analyzes surface roughness. Topographical measurements are performed at a rate of up to 117 fps, and step heights from ~20 nm up to the millimeter range are detected at a depth of focus previously achieved only by scanning electron microscopes. Materials that can be analyzed include LCD panels, semiconductors, color filters, glass, polymers and metals. All major functions and measurement parameters are controlled through the large LCD control panel.