Veeco Instruments Inc.’s Thermal Analysis (VITA) module has been released for the company’s line of scanning probe microscopes. The technology advances nanoscale materials identification by providing characterization capabilities through nanoscale thermal analysis, scanning thermal microscopy and heated-tip atomic force microscopy. It offers lateral resolution to <100 nm and full digital control of heating cycles. The module connects to a PC via USB or RS-232. Thermomechanical analysis offers heating rates up to 600,000 °C/min.