Search
Menu
AdTech Ceramics - Ceramic Packages 1-24 LB

Wafer Inspection System

Facebook X LinkedIn Email
DigiPol Technologies
FLANDERS, N.J., Feb. 13, 2009 – Rudolph Technologies Inc. has announced that its NSX series wafer inspection system now includes WaferWoRx probing process analysis, which identifies the cause of probe test failure mechanisms, providing faster problem resolution and improved yield. The NSX System detects probe marks and generates location and size information and other parameters. WaferWoRx converts what has been a manual and time-consuming process of gathering scrub data from various tools, correlating the data, and sifting through for trends, to automated data collection and analysis completed in a single step. It breaks...See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.