Request InfoMalvern Panalytical Inc.PANalytical has launched the 2830 ZT, a wafer analyzer that performs simultaneous noncontact determination of layer thickness and composition on wafers up to 300 mm. The wavelength dispersive x-ray fluorescence instrument also determines contamination, dopant levels and surface uniformity, and it measures up to 24 elements on stacks of up to 16 layers. It operates at a constant current of 160 mA and is supplied with the company’s SuperQ software.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 10/19/2022Optical 3D Measuring MachineThe ScanBox Series 5 from ZEISS Industrial Quality Solutions is an optical 3D measuring machine that captures the entire surface geometry, as well as hole patterns and other characteristics of the...Photonics.com 3/25/2024Wafer Inspection SystemThe LS9300AD from Hitachi is a system for inspecting the front and backside of non-patterned wafer surfaces for particles and defects. 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