Apr 2009Veeco Instruments Inc.Request Info
Veeco Instruments Inc. has unveiled the Dimension Icon atomic force microscope (AFM). Its closed-loop head scans at high speeds and delivers low drift and low noise, decreasing stabilization times and allowing the system to acquire artifact-free data quickly. The high-resolution camera and integrated feedback alignment tools provide fast probe positioning and sample navigation, enabling users to locate features of interest more easily. The redesigned software offers an intuitive work flow and default experiment modes that distill advanced AFM processes into preconfigured settings.