Princeton Instruments/Acton has launched its TriVista confocal Raman microscopy system. The triple spectrograph detects minute structural changes with resolution up to 0.13 cm–1 and low-frequency Raman bands at less than 5 cm–1 from the laser line. Multiple laser options enable users to integrate single lasers or existing laser systems to achieve several excitation wavelengths without multiple notch filters. Choices of either an Olympus upright BX51 or an inverted IX71 microscope and a wide variety of detectors maximize flexibility. The system switches easily between micro and bulk samples and collects accurate structural information under extreme temperature and pressure conditions. High-stability base plates ensure low vibration and repeatability for sensitive experiments. A software interface switches between additive and subtractive modes, calibrates the spectrograph, selects grating and motion, operates slit and stage movements, and controls the CCD detectors.