Search
Menu
BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

Microscope System

Veeco Instruments Inc.Request Info
 
Facebook X LinkedIn Email
Veeco.jpgThe Dimension Icon P series atomic force microscope (AFM) systems have been unveiled by Veeco Instruments Inc. With the introduction of the Icon-PT and Icon-PI AFMs, users can purchase a scalable Icon platform with the same microscope head, low drift and low noise necessary to produce artifact-free images in minutes. The Icon-PI produces high-resolution 1 k × 1 k images and is designed for use on a vibration isolation table. The Icon-PT offers high-speed data capability and user-configurable lock-in amplifiers, and it features 5 k × 5 k images as well as a set of options, including a heater, a cooler and proprietary thermal analysis technology.


Published: October 2009
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Veeco Instruments Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

AFMartifact-free imagesatomic force microscopeBasic ScienceBiophotonicsBreakthroughProductsDimension Icon PIcon-PIIcon-PTImaginglock-in amplifiersmicroscope headMicroscopythermal analysisVeecoVeeco Instruments Inc.vibration isolation table

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.