Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn

Photovoltaic System

Photonics Spectra
Oct 2009
CRAIC TechnologiesRequest Info
 
CRAIC.jpgCraic Technologies Inc. has launched its QDI 2010 Film, a microspectrophotometer designed to rapidly and nondestructively measure the thickness of thin films of photovoltaic cells. Combining microspectroscopy with software, it enables the user to measure film thickness by either transmission or reflectance of many types of materials and substrates. Sampling area ranges from >1 to >100 μm. When combined with the company’s contamination imaging capabilities, it can test the transmissivity of photovoltaic cell protective covers. Contamination analysis and transmissivity testing can be added easily to the instrument.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
GLOSSARY
reflectance
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
transmissivity
The internal transmittance per unit thickness of a nondiffusing material.
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!