Oct 2009Lumen DynamicsRequest Info
Optical Power Measurement SystemMISSISSAUGA, Ontario, Canada, Oct. 29, 2009 – Exfo Electro-Optical Engineering Inc.’s Life Sciences and Industrial Division has introduced the X-Cite XR2100 handheld power meter and the XP750 objective plane power sensor for fluorescence microscopy applications. The devices allow researchers to measure the optical power at the specimen level, enabling consistent and repeatable illumination throughout their experiments.
With its sleek low profile, designed specifically to fit on the microscope stage, the XP750 offers the versatility of measuring output from an X-Cite illuminator or any other epi-fluorescence light source, including HBO/mercury, metal halide or xenon lamps, lasers and LEDs. It performs effectively with a wide range of microscope configurations and with power sensitivity at levels from 5 µW to 500 mW at wavelengths between 320 and 750 nm.
It fits into a standard microscope clip for convenient measuring of light directly from the objective, without removing or reconfiguring equipment, and it positions the light sensor at the objective focal plane. Its large detection surface area of 10 mm makes it appropriate for use with both low- and high-magnification objectives.
Featuring a control keypad interface, the XR2100 enables power measurements to be stored to the unit itself or downloaded directly into exportable data files via a computer. By offering a convenient way to manage settings and data from a desktop, it enables researchers to maintain exportable data files together with imaging data to provide complete experiment records that facilitate compliance with Good Laboratory Practices.
The XR2100 includes an adapter for a 3-mm lightguide, software, cables and a user manual. Power range is from 50 mW to 10 W, measurement resolution is from 0.1 mW to 0.01 W, response time is 1 s, and the wavelength range is from 340 to 675 nm.
For more information, visit: www.LDGI-XCite.com