Request InfoCarl Zeiss Microscopy LLCCarl Zeiss MicroImaging Inc. has added new functions to its Axio CSM 700 confocal light microscope. Materials scientists now can measure 3-D topography over large sample areas more easily. Scanning stage control is integrated into the software and allows large sample areas to be captured in a mosaic fashion. The stitching algorithm ensures that no transitions are perceived between the single images in the final mosaic. The encoded and motorized objective nosepiece facilitates operation. English units such as inches and microinches have been integrated into the software, resulting in improved...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 7/21/2023In-Line Subsurface Metrology SystemThe AUDIRA™ nondestructive, in-line subsurface metrology system from Nearfield Instruments BV enables accurate and reproducible nm-level measurements of buried features and defects in advanced...Photonics Spectra May 2024 Issue3D Measuring DeviceThe FocusX from Bruker Alicona is an optical 3D measuring device meant for applications where highly reflective surfaces, steep flanks, and complex forms must be measured. Able to measure small...Photonics.com 3/21/2024Probe MicroscopeThe INX™ 760 from VIAVI is a single, duplex, and multi-fiber probe microscope for reducing time in the construction, activation, and maintenance of complex fiber networks. 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