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  • C11118GA NIR Spectrometer
Feb 2010
Hamamatsu CorporationRequest Info
BRIDGEWATER, N.J., Feb. 10, 2010 – Hamamatsu Corp. has introduced the C11118GA, part of its TG series long-wavelength-type near-infrared miniature spectrometers for process measurements. Optimized for carbon-hydrogen combinational measurements such as asphaltene, cellulose and carbonates, as well as for soil and component analysis, the device simultaneously measures from 900 to 2550 nm. Process measurements benefit from its high sensitivity and fast acquisition times.

Integration times of 6 µs measure all wavelengths simultaneously, preventing data blur from rapidly changing samples. Typical integration times range from 6 to 40,000 µs.

The spectrometer’s doubled slit area and new diffraction grating maximize the signal. The input slit measures 140 × 250 µm and has an optical numerical aperture of 0.22. A proprietary quartz master transmission grating provides higher performance from 2000 to 2550 nm. Other features include USB 2.0 compatibility, seven selectable triggering modes and two gain modes. The system comprises a polychromator integrated with optical elements and an InGaAs linear image sensor. Light to be measured is guided into the entrance port through an optical fiber, and the spectrum measured with the built-in image sensor is output from the USB port to a PC for data acquisition.

Maximum spectral resolution is 20 nm, maximum wavelength reproducibility is ±0.8 nm, maximum wavelength temperature dependence is ±0.08 nm/°C, maximum spectral stray light is -30 dB, and maximum broadband stray light is -25 dB.

Measuring 142 × 218 × 80 mm, the device offers 16-bit analog-to-digital conversion and an operating temperature range of 5 to 35 °C. It ships with evaluation software for setting measurement conditions, acquiring and saving spectrum data, and displaying data graphs, as well as with an application-specific programming package, the device driver and a dynamic link library.


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A kind of spectrograph in which some form of detector, other than a photographic film, is used to measure the distribution of radiation in a particular wavelength region.  
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