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  • 20/20 UV-VIS-NIR Microspectrophotometer
Feb 2010
CRAIC TechnologiesRequest Info
SAN DIMAS, Calif., Feb. 24, 2010 – Craic Technologies Inc. has announced the 20/20 UV-VIS-NIR microspectrophotometer that incorporates the latest technological advances in optics, spectroscopy and software and is designed to nondestructively analyze many types of microscopic samples from the deep-ultraviolet to the near-infrared.

This flexible instrument acquires and analyzes data from microscopic samples smaller than 1 µm across — by absorbance, reflectance, emission, luminescence, polarization and fluorescence spectroscopy — with high speed and accuracy. It also can determine the thickness of thin films and color spaces and can perform color imaging.

Applications include forensic analysis of trace evidence, vitrinite reflectance of coal, spectral analysis of minerals, measurement of protein crystals, contamination analysis, and thin-film measurement of semiconductors, hard disks and flat panel displays. Other uses include MEMS (microelectromechanical systems) devices, surface plasmon resonance, photonic bandgap crystals, and drug and combinatorial chemistry. The instrument is calibrated using Standard Reference Materials from NIST.

The microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-VIS-NIR range microscope and easy-to-use software. With high-resolution digital imaging, it also can be used as an ultraviolet or infrared microscope. Features include touch screen controls, calibrated variable apertures, high sensitivity, a durable design, automation, ease-of-use, and multiple imaging and spectroscopic techniques. An integrated thermoelectrically cooled array detector ensures low noise and long-term stability.


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The natural log of the ratio of absorbed intensity over the total intensity which gives a constant value assuming a stable volume as well as energy. In optical physics the absorbance may be defined as the absorption cross section multiplied by the absorbing material length.
The emission of light or other electromagnetic radiation of longer wavelengths by a substance as a result of the absorption of some other radiation of shorter wavelengths, provided the emission continues only as long as the stimulus producing it is maintained. In other words, fluorescence is the luminescence that persists for less than about 10-8 s after excitation.
See fluorescence; phosphorescence.
With respect to light radiation, the restriction of the vibrations of the magnetic or electric field vector to a single plane. In a beam of electromagnetic radiation, the polarization direction is the direction of the electric field vector (with no distinction between positive and negative as the field oscillates back and forth). The polarization vector is always in the plane at right angles to the beam direction. Near some given stationary point in space the polarization direction in the beam...
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
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