Carl Zeiss MicroImaging Inc. has expanded the functions on its Axio CSM 700 confocal light microscope to enable materials scientists to measure the 3-D topography over large sample areas. A motorized scanning stage with 150 x 150-mm travel is suitable for materials research and quality inspection. Scanning stage control is integrated into the software to allow large sample areas to be captured in a mosaic fashion. A stitching algorithm assures that no transitions are perceived between the single images in the final mosaic image. The microscope provides noncontact measurement of roughness on soft surfaces. Topographical measurements can be performed at >100 fps. Additional benefits include reliable detection of height information with step heights from 20 nm up to the millimeter range. The software provides numerous analysis options, and a newly programmed filter facilitates image processing.