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Scanning probe

BioPhotonics
Sep 2006
Veeco Instruments Inc.Request Info
 
Veeco Instruments Inc. designed the Multimode V and Dimension V scanning probe microscopes to measure small and large objects, respectively. They can measure characteristics such as topography, elasticity and friction with scanning tunneling microscopy and atomic force microscopy. They feature software designed for new or infrequent users of such microscopes and architecture that is compatible with various programming languages. The instruments contain the Nanoscope V controller, enabling thermal tuning of cantilever resonances up to 2 MHz and the simultaneous capture of up to eight images at a frequency of 50 MHz and a resolution of 5000 x 5000 pixels.


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